Teodor Gotszalk

Teodor Paweł Gotszalk (20 June 1966 – 21 November 2025) was a Polish scientist who was head of Department of Nanometrology at Wrocław University of Science and Technology. He was also a corresponding member of Polish Academy of Sciences from 2022. Teodor Gotszalk worked in the area of nanotechnology and nanometrology, particularly scanning probe microscopy (SPM), scanning electron microscopy (SEM) and focused ion beam (FIB) techniques, and using microelectromechanical systems (MEMS).

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